Scaling of critical currents in high-temperature superconducting superlattices and thin films

We report the measurement of transport critical current densities in a wide variety of high-temperature superconducting (high T_c) superlattices and thin films. We find that the temperature dependence of the critical current density J_c for all samples may be collapsed into a single curve through the scaling relation J_c(t)=J_c(0)(1-t)^1.6, where t=T/T_c(H,Θ). This scaling relation remains valid in fields of up to 5 T and in all field directions Θ with respect to the c axis of the sample with the field kept perpendicular to the current.