Total-dose radiation hardness assurance for space electronics
Abstract
An improved standard total-dose test method is described to qualify electronics for a low-dose radiation environment typical of space systems. The method consists of Co-60 irradiation at a dose rate of 1 to 3 Gy(Si)/s (100 to 300 rad(Si)/s) and a subsequent 373 K (100 C) bake. New initiatives in radiation hardness assurance are also briefly discussed, including the Qualified Manufacturers List (QML) test methodology and the possible use of 1/f noise measurements as a nondestructive screen for oxide-trap charge related failure.
- Publication:
-
Space Nuclear Power Systems
- Pub Date:
- 1991
- Bibcode:
- 1991snpw.proc..846W
- Keywords:
-
- Baking;
- Cobalt 60;
- Radiation Dosage;
- Radiation Hardening;
- Semiconductor Devices;
- Aerospace Systems;
- Annealing;
- Metal Oxide Semiconductors;
- Nondestructive Tests;
- Radiation Effects;
- Electronics and Electrical Engineering