Non-stoichiometric defects in YBaCuO thin films

Defects in superconducting YBaCuO thin films deposited by laser ablation are investigated by high resolution transmission electron microscopy. Micrographs reveal numerous defects in the YBaCuO film, falling into four basic classes. One of these is an interesting, non-stoichiometric helical defect structure which possibly corresponds to a growth-related screw dislocation. In general, defects in the YBaCuO film are associated both with growth geometry and with local deviations in stoichiometry. Substrate surface geometry is seen to have a profound effect on the number and type of defects produced. Simulation of annealing transformations using a static lattice, three dimensional, Monte Carlo technique is carried out to gain further insight into specific defect formation mechanisms. The results of these studies suggest preparation conditions that are expected to lead to films with improved critical current densities.