Analysis of depth profiles of sol-gel derived multilayer coatings by Rutherford backscattering spectrometry and by cross-sectional transmission electron microscopy
Abstract
- Publication:
-
Journal of Materials Research
- Pub Date:
- April 1991
- DOI:
- 10.1557/JMR.1991.0835
- Bibcode:
- 1991JMatR...6..835S