Structure of YBa2Cu3O(7-delta) epitaxial films on lanthanum orthoaluminate substrates
Abstract
The structure of epitaxial layers of YBa2Cu3O(7-delta) on (111) LaAlO3 substrates was investigated by X-ray diffraction analysis. The film is characterized by the presence of three mutually perpendicular systems of domains, with the c axis oriented along the (100) directions. An analysis of the reflexes has revealed a tensile strain of 0.0012 due to thermal stresses of 220 MPa in the film-substrate system.
- Publication:
-
Fizika Nizkikh Temperatur
- Pub Date:
- June 1991
- Bibcode:
- 1991FizNT..17..761A
- Keywords:
-
- Aluminates;
- Copper Oxides;
- High Temperature Superconductors;
- Lanthanum Compounds;
- Mixed Oxides;
- Superconducting Films;
- Barium Oxides;
- Crystal Structure;
- Single Crystals;
- Substrates;
- Thermal Stresses;
- Yttrium Oxides;
- Solid-State Physics