Simulation of radiation induced circuit failure modes in SOS integrated circuits
Abstract
The design of radiation hard integrated circuits is discussed. The complex interaction between the several distinct effects of radiation on an individual transistor's characteristic is considered. Existing simulations often examine only one effect at any one time, and then in a crude global manner. The task of predicting the combined effects of these phenomena on a circuit as a whole is difficult, and as a result critical circuit failure mechanisms can often be overlooked. The major radiation effects with which the designer is concerned and some techniques used to predict their combined effect using the SPICE circuit simulator are described. An example of some of the results of this kind of analysis are presented, together with some conclusions drawn from them. Suggestions for future improvements in modeling and simulation techniques are made.
- Publication:
-
ESA Special Publication
- Pub Date:
- March 1991
- Bibcode:
- 1991ESASP.313..387T
- Keywords:
-
- Circuit Reliability;
- Failure Analysis;
- Failure Modes;
- Integrated Circuits;
- Prediction Analysis Techniques;
- Radiation Effects;
- Sos (Semiconductors);
- Electronic Equipment Tests;
- Parameter Identification;
- Space Environment Simulation;
- Electronics and Electrical Engineering