Error analysis for refractive-index profile determination from near-field measurements
Abstract
Refractive-index profiles of diffused optical waveguides are determined by analyzing the near-field pattern of the waveguide. For this method, a computer simulation of measurement errors due to noise, quantization, defocusing, and nonlinearity of the camera system is obtained using data of a typical camera measurement system. The simulation procedure includes signal processing of the measurement intensity profile by means of a cubic spline approximation in order to reduce the influence of the measurement-system errors. The residual errors associated with this technique are on the order of a few percent when measuring typical Ti:LiNbO3 waveguides.
- Publication:
-
Journal of Lightwave Technology
- Pub Date:
- May 1990
- DOI:
- 10.1109/50.54467
- Bibcode:
- 1990JLwT....8..625H
- Keywords:
-
- Error Analysis;
- Lithium Niobates;
- Near Fields;
- Optical Waveguides;
- Refractivity;
- Signal Processing;
- Approximation;
- Computerized Simulation;
- Flow Charts;
- Newton-Raphson Method;
- Spline Functions;
- Titanium;
- Optics