An overview of radiation-induced interface traps in MOS structures Oldham, T. R. ; McLean, F. B. ; Boesch, H. E., Jr. ; McGarrity, J. M. Abstract Publication: Semiconductor Science Technology Pub Date: December 1989 DOI: 10.1088/0268-1242/4/12/004 Bibcode: 1989SeScT...4..986O