Estimation of percentage relaxation in Si/Si1-xGex strained-layer superlattices Halliwell, M. A. G. ; Lyons, M. H. ; Davey, S. T. ; Hockly, M. ; Tuppen, C. G. ; Gibbings, C. J. Abstract Publication: Semiconductor Science Technology Pub Date: January 1989 DOI: 10.1088/0268-1242/4/1/002 Bibcode: 1989SeScT...4...10H