Effect of Flux Creep on Current-Voltage Characteristics of Superconducting Y-Ba-Cu-O Thin Films
Abstract
Temperature dependence of current-voltage characteristics of Y-Ba-Cu-O thin films is studied experimentally. The observed results are analyzed with the flux creep model, and good agreement is obtained between the theory and the experiment. Using the flux creep model, the pinning potential, U, is obtained as U(T{=}0)≳77 meV for thin films with jc(T{=}0)≳2× 107 A/cm2. The temperature dependence of U is also obtained, and the result is discussed based on the pinning theory.
- Publication:
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Japanese Journal of Applied Physics
- Pub Date:
- June 1989
- DOI:
- Bibcode:
- 1989JaJAP..28L.991E
- Keywords:
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- Copper Oxides;
- Flux Pinning;
- High Temperature Superconductors;
- Superconducting Films;
- Thin Films;
- Volt-Ampere Characteristics;
- Barium Compounds;
- Current Density;
- Temperature Dependence;
- Yttrium Compounds;
- Solid-State Physics