Effects of heavy ions on microcircuits in space: Recently investigated upset mechanisms
Abstract
Upset of microcircuits in space have been attributed to heavy ions. In recent studies of the failure mechanisms, we have employed a wide range of test methods. These studies and the application of the test results to space-borne microcircuits are presented.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- October 1988
- Bibcode:
- 1988STIN...8918603K
- Keywords:
-
- Aerospace Environments;
- Cosmic Rays;
- Heavy Ions;
- Microelectronics;
- Single Event Upsets;
- Damage;
- Electronic Equipment;
- Evaluation;
- Failure;
- Performance Tests;
- Electronics and Electrical Engineering