Erratum: Structural Characterization of the Si(111)-CaF2 interface by high-resolution transmission electron microscopy [Phys. Rev. Lett. 61, 2274 (1988)]
Abstract
- Publication:
-
Physical Review Letters
- Pub Date:
- December 1988
- DOI:
- 10.1103/PhysRevLett.61.2973.2
- Bibcode:
- 1988PhRvL..61.2973T