Comparison of amorphous and quasicrystalline films of sputtered Al0.72Mn0.22Si0.06
Abstract
X-ray data were collected on films of Al0.72Mn0.22Si0.06 sputtered on NaCl at 45, 150, and 230 °C. The 45 °C films show a typical metallic-glass structure factor, S(Q), while at 230 °C the structure is quasicrystalline plus Al. A combined particle-size and phason strain broadening was applied to the normalized and reduced S(Q) for the 230 °C film to bring it essentially into coincidence with the amorphous (45 °C S(Q) leading us to conclude that the glass, or amorphous, phase represents a defect limit of the quasicrystal.
- Publication:
-
Physical Review Letters
- Pub Date:
- May 1988
- DOI:
- Bibcode:
- 1988PhRvL..60.2062R
- Keywords:
-
- Aluminum Compounds;
- Amorphous Materials;
- Metallic Glasses;
- Sputtering;
- Thin Films;
- X Ray Analysis;
- Lorentz Transformations;
- Manganese Compounds;
- Silicon Compounds;
- Sodium Chlorides;
- Solid-State Physics;
- 61.50.Em;
- 61.40.+b;
- 61.55.Hg