Bragg diffraction by amorphous silicon
Abstract
The observation of Bragg diffraction from supernanometer regions of 'amorphous' silicon reveals the existence of crystalline clusters too small to be observed by X-ray diffraction in bulk. The clusters are imaged by high-resolution transmission electron microscopy. These observations support a submicrocrystalline model for the structure of non-crystalline solids.
- Publication:
-
Nature
- Pub Date:
- January 1987
- DOI:
- 10.1038/325121a0
- Bibcode:
- 1987Natur.325..121P
- Keywords:
-
- Amorphous Silicon;
- Bragg Angle;
- Crystal Structure;
- Crystallinity;
- Crystal Lattices;
- Electron Microscopy;
- X Ray Diffraction;
- Solid-State Physics