Determination of resistivity and permittivity profiles of a layered Earth
Abstract
An algorithm for determination of depth profiles of resistivity and permittivity of a layered Earth is presented. The algorithm uses wide-band measurements of the Earth surface impedance, at low frequencies or at high frequencies. An Earth model which consists of a large number of thin layers is adopted. The layer thickness is taken constant relative to the local skin depth in the low frequency case. In the high frequency case, the time delay through each layer is the constant parameter. The surface reflection coefficient of the adopted model is expressed as a ratio of two polynomials in a normalized frequency parameter. The model parameters are estimated by fitting the surface measurements to the model theoretical response. Results show that the method can predict profiles even in cases of very sharp changes of resistivity.
- Publication:
-
IGARSS 1986: Remote Sensing: Today's Solutions for Tomorrow's Information Needs
- Pub Date:
- August 1986
- Bibcode:
- 1986rsmt.conf..205A
- Keywords:
-
- Algorithms;
- Depth;
- Electrical Resistivity;
- Permittivity;
- Soils;
- Earth Surface;
- Parameterization;
- Polynomials;
- Geophysics