Failure analysis of integrated circuits - Case studies
Abstract
Steps essential to the failure analysis of electronic components are documentation of the failure conditions, precise identification of electrical faults, selection of an inspection technique that does not disturb a failed component, and correlation of failed components with electrical data. The procedures are illustrated with sample analyses which revealed a contaminant particle in a failed 4 kRAM chip, contaminants causing electrical shorting of a microprocessor, and defective pins on 64 kRAM chips which failed in lots during aging tests.
- Publication:
-
Quality, Components and Electronic Technology; International Space Technology Course
- Pub Date:
- 1986
- Bibcode:
- 1986qcet.proc.1031V
- Keywords:
-
- Case Histories;
- Failure Analysis;
- Integrated Circuits;
- Microprocessors;
- Random Access Memory;
- Chips (Memory Devices);
- Electrical Faults;
- Electronic Equipment Tests;
- Fabrication;
- Electronics and Electrical Engineering