Evaluation of high temperature accelerated aging tests used on integrated circuits
Abstract
Accelerated aging tests such as high temperature burn-in, which are in current use on Bendix Kansas City Division's (BKC) purchased small and medium scale integrated circuits, were evaluated to determine if they are effective and necessary to ensure the required reliability. A theoretical analysis, a literature search, and a study of lot acceptance results were used to assess the value of integrated circuit burn-in.
- Publication:
-
Final Report Allied Bendix Corp
- Pub Date:
- April 1986
- Bibcode:
- 1986abc..rept.....G
- Keywords:
-
- Accelerated Life Tests;
- High Temperature Tests;
- Integrated Circuits;
- Large Scale Integration;
- Life (Durability);
- Chemical Reactions;
- Criteria;
- Defects;
- Failure Analysis;
- Electronics and Electrical Engineering