X-ray calibration: techniques, sources, and detectors. Proceedings ofa conference held at San Diego, CA, USA, 19 - 20 August 1986.

Papers are presented on absolute intensity measurements in the vacuum UV; a Penning discharge source for EUV calibration; a laser produced plasma XUV radiation source; a variable pressure ion chamber for relative and absolute flux measurements; calibration of a 1-m diameter normal incidence EUV telescope/spectrometer; VUV spectrometer-detector system calibration using synchrotron radiation; and Wolter X-ray microscope calibration. Consideration is given to techniques of absolute low energy X-ray calibration; the evaluation of gratings for the Extreme UV Explorer (EUVE); soft X-ray calibration of diffracting materials; and the calibration of the thin film filters for the EUVE. Topics discussed include facilities and techniques for X-ray diagnostic calibration in the 100 eV to 100 KeV energy range; XUV radiometric standards at NBS; Los Alamos X-ray characterization facilities for plasma diagnostics; the calibration of solar EUV instrumentation in space; and direct X-ray response of charge-coupled devices and photodiode linear arrays.