High-frequency noise of In(y)Ga(1-y)As/Al(x)Ga(1-x)As MODFETs and comparison to GaAs/Al(x)Ga(1-x)As MODFETs

Noise parameter measurements for recently developed 1 micron gate In(y)Ga(1-y)As/Al(0.15)Ga(0.85)As MODFETs have been performed at 8 GHz art room and cryogenic temperatures. Owing to the relatively small C(gs/sq rt) g(m) ratio in these devices compared to identical conventional GaAs/AlGaAs MODFETs, both room- and cryogenic temperature noise figures have been reduced. In addition, the light sensitivity and drift in noise figure at cryogenic temperatures observed in conventional GaAs/AlGaAs MODFETs have been substantially reduced.