Computer simulation of schlieren images of rotationally symmetric plasma systems: a simple method
Abstract
Schlieren techniques are commonly used methods for quantitative analysis of cylindrical or spherical index of refraction profiles. Many schliren objects, however, are characterized by more complex geometries, so we have investigated the more general case of noncylindrical, rotatially symmetric distributions of index of refraction n(r,z). Assuming straight ray paths in the schlieren obwject we have calculated twodimensional beam deviation profiles. It is shown that experimental schliren images of the noncylindrical plasma generated by a plasma focus device can be simulated with these deviation profiles. The computer simulation allows a quantitative analysis of these schlieren images, which yields, for example, the plasma parameters, electron density, and electron density gradients.
 Publication:

Applied Optics
 Pub Date:
 March 1986
 DOI:
 10.1364/AO.25.000769
 Bibcode:
 1986ApOpt..25..769N
 Keywords:

 Computerized Simulation;
 Cylindrical Plasmas;
 Plasma Diagnostics;
 Rotating Plasmas;
 Schlieren Photography;
 Spherical Plasmas;
 Electron Density (Concentration);
 Electron Distribution;
 Image Analysis;
 Refractivity;
 Instrumentation and Photography;
 SCHLIEREN TECHNIQUE;
 PLASMAS