An optoelectronic system for fringe pattern analysis
Abstract
A system capable of retrieving and processing information recorded in fringe patterns is reported. The principal components are described as well as the architecture in which they are assembled. An example of application is given.
- Publication:
-
IN: 1985 SEM Spring Conference on Experimental Mechanics
- Pub Date:
- 1985
- Bibcode:
- 1985sem..conf..861S
- Keywords:
-
- Diffraction Patterns;
- Electro-Optics;
- Image Processing;
- Nondestructive Tests;
- Buffer Storage;
- Displacement Measurement;
- Hardware;
- Pipelining (Computers);
- Strain Measurement;
- Instrumentation and Photography