Infrared technology X. Conference held at San Diego, Calif., USA, 23 - 24 August 1984.
Abstract
The present conference covers devices for the measurement of MTFs in the IR, an experimental quantification of the effect of clutter on target selection, the calculated detectivity of Schottky barrier detectors, multidetector thermal imagers' development history, a transmittance model for atmospheric methane, photovoltaic CdHgTe-Si hybrid focal planes, and focal plane architectures applicable to advanced imaging seekers. Also discussed are IR flight simulation using computer-generated imagery, proposed molecular transmission band models for the LOWTRAN code, Ge aspheric single lenses for earth sensing applications, the use of IR spectroscopy in industrial flare performance monitoring, and novel NDT IR thermographic methods for the assessment of flaw delaminations in flight hardware.
- Publication:
-
Infrared technology X
- Pub Date:
- 1985
- Bibcode:
- 1985SPIE..510.....S
- Keywords:
-
- Conferences;
- Infrared Detectors;
- Infrared Instruments;
- Technology Assessment;
- Absorptivity;
- Antireflection Coatings;
- Atmospheric Attenuation;
- Charge Coupled Devices;
- Computer Systems Programs;
- Electrical Resistivity;
- Electromagnetic Interference;
- Flight Simulation;
- Focal Plane Devices;
- Imaging Techniques;
- Infrared Astronomy Satellite;
- Infrared Imagery;
- Mercury Cadmium Tellurides;
- Methane;
- Missile Control;
- Modulation Transfer Function;
- Optical Measuring Instruments;
- Optical Properties;
- Shutters;
- Signal To Noise Ratios;
- Spatial Resolution;
- Spectral Sensitivity;
- Target Acquisition;
- Transmittance;
- Instrumentation and Photography