Transistor-transistor logic microcircuit tester
Abstract
Digital microcircuits currently in use need to be tested before final installation. A tester consisting of a control code former and comparison and indication devices is discussed. The importance of limiting the duration of load on the HL1 light diode to prevent burn-out is stressed. With a frequency coefficient of 1024, all states are indexed about 1000 times per second. Technical features of the tester are diagrammed and described. Correct switch-on of microcircuits and the variety of applications for the testers to a number of microcircuits with varying input and output set-ups are summarized.
- Publication:
-
USSR Rept Electron Elec Eng JPRS UEE
- Pub Date:
- March 1985
- Bibcode:
- 1985RpEEE.......32Z
- Keywords:
-
- Circuit Reliability;
- Light Emitting Diodes;
- Logic Circuits;
- Measuring Instruments;
- Microelectronics;
- Transistor Circuits;
- Digital Systems;
- Loads (Forces);
- Switching;
- Electronics and Electrical Engineering