Correlation between Time-Resolved Soft X-Ray Images and Interferometric Results in a Plasma Focus
Abstract
A time-resolved soft X-ray pinhole camera equipped with a microchannel plate as an image sensor was successfully developed for observation of a rapidly-changing plasma produced by a plasma focus device. Simultaneous observation with the pinhole camera and a Mach-Zehnder interferometer was carried out. This observation showed that the soft X-rays are emitted from the collapse phase to the disruption of the plasma focus. A high-intensity spot of the soft X-rays is recognized just before the disruption of the plasma column. In spite of the higher resistivity of the plasma column, it is found that the soft X-ray emission is not intense after the disruption. This comes from the rapid decrease of the electron density in this phase.
- Publication:
-
Japanese Journal of Applied Physics
- Pub Date:
- November 1985
- DOI:
- 10.1143/JJAP.24.1514
- Bibcode:
- 1985JaJAP..24.1514H
- Keywords:
-
- Interferometry;
- Plasma Diagnostics;
- Plasma Focus;
- Plasma Radiation;
- X Ray Imagery;
- Image Correlators;
- Mach-Zehnder Interferometers;
- Plasma Conductivity;
- Temporal Resolution;
- Plasma Physics