Simple calculation of the Hall coefficient of thin metal films
Abstract
A relationship is analytically defined between the Hall coefficient and the product of the resistivity and the temperature coefficient of a thin metal film. Attention is given to the electrical characteristics of the metal film in terms of the true electron path in a Larmor orbit, the scattering probability, the effects on the path by simultaneously-applied electric and magnetic fields, and the sample conductivity. Account is taken of the presence of impurities and an expression is found for the Hall coefficient in homogeneous materials. The coefficient is proportional to the resistivity and temperature of the metal.
- Publication:
-
Journal of Materials Science Letters
- Pub Date:
- May 1985
- Bibcode:
- 1985JMSL....4..585T
- Keywords:
-
- Film Thickness;
- Hall Effect;
- Metal Films;
- Thin Films;
- Electric Fields;
- Electrical Resistivity;
- Polycrystals;
- Single Crystals;
- Specimen Geometry;
- Temperature Effects