Review of the NASA Voyager spacecraft polycarbonate capacitor failure incident
Abstract
The premission failure of a Voyager spacecraft capacitor has prompted an investigation into the use of polycarbonate capacitors in high impedance circuits, during which capacitor failures were induced by thermal cycling together with extended periods at high temperature. Measurement of leakage path temperature coefficients indicates that there are two distinct leakage types whose mechanisms are complicated by movement within the capacitor during temperature changes. A novel system for pulse detection during capacitor burn-in and ramp testing has proven to be beneficial.
- Publication:
-
IEEE Transactions on Electrical Insulation
- Pub Date:
- February 1985
- Bibcode:
- 1985ITEI...20...47O
- Keywords:
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- Capacitors;
- Electrical Faults;
- High Temperature Tests;
- Materials Tests;
- Polycarbonates;
- Voyager 1 Spacecraft;
- High Voltages;
- Low Voltage;
- Thermal Cycling Tests;
- Voyager 2 Spacecraft;
- Electronics and Electrical Engineering