Thermally accelerated life testing of single mode, double-heterostructure, AlGaAs laser diodes operated pulsed at 50 mW peak power
Abstract
The reliability of single spatial mode, double heterostructure, channel subscale planar AlGaAs laser diodes for a digital optical commumication system intended for use in space is presently determined through life testing under thermally accelerated conditions over the course of 14,000 hours. Test results obtained for all diodes with failure defined by power degradation alone are compared with those for single mode diodes whose failure is defined by power degradation, wavelength shift, and spatial mode changes. While life test results are essentially equivalent, they differ from earlier published reports for laser diodes operated in CW. A test scheme is proposed which incorporates a method for the separation of bulk material, current, and optical density-induced degradation effects.
- Publication:
-
IEEE Journal of Quantum Electronics
- Pub Date:
- April 1985
- DOI:
- 10.1109/JQE.1985.1072660
- Bibcode:
- 1985IJQE...21..365B
- Keywords:
-
- Accelerated Life Tests;
- Gallium Arsenide Lasers;
- Heterojunction Devices;
- Optical Communication;
- Pulsed Lasers;
- Space Communication;
- Thermal Degradation;
- Aluminum Gallium Arsenides;
- Failure Modes;
- High Power Lasers;
- Laser Outputs;
- Laser Stability;
- Pulse Communication;
- Reliability Analysis;
- Threshold Currents;
- Lasers and Masers