Data and results of a laboratory investigation of microprocessor upset caused by simulated lightning-induced analog transients
Abstract
Advanced composite aircraft designs include fault-tolerant computer-based digital control systems with thigh reliability requirements for adverse as well as optimum operating environments. Since aircraft penetrate intense electromagnetic fields during thunderstorms, onboard computer systems maya be subjected to field-induced transient voltages and currents resulting in functional error modes which are collectively referred to as digital system upset. A methodology was developed for assessing the upset susceptibility of a computer system onboard an aircraft flying through a lightning environment. Upset error modes in a general-purpose microprocessor were studied via tests which involved the random input of analog transients which model lightning-induced signals onto interface lines of an 8080-based microcomputer from which upset error data were recorded. The application of Markov modeling to upset susceptibility estimation is discussed and a stochastic model development.
- Publication:
-
In its Intern. Aerospace and Ground Conf. on Lightning and Static Elec. 12 p (SEE N85-16343 07-47
- Pub Date:
- December 1984
- Bibcode:
- 1984lse..conf.....B
- Keywords:
-
- Airborne/Spaceborne Computers;
- Digital Systems;
- Electric Current;
- Electric Potential;
- Electromagnetic Interference;
- Lightning;
- Transient Response;
- Control;
- Electromagnetic Fields;
- Fault Tolerance;
- Intel 8080 Microprocessor;
- Markov Processes;
- Microcomputers;
- Statistical Analysis;
- Communications and Radar