High temperature electronics technology: Life test report
Abstract
This report presents the results of a series of life tests of silicon Integrated Injection Logic (I2L) microcircuits designed to operate for long periods at temperatures as high as 300 C. The technology needed to design and fabricate these microcircuits was previously developed under Contract N00173-79-C-0010. Two life tests were conducted: an operating-life test at 300 C and a nonoperating-life test at 360 C. Ten chip packages, each containing four identical ring oscillator/counter test circuits, were tested at each temperature. A total of 80 microcircuits were fabricated using two different metallization processes. None of the 300 C test specimens failed; 24 circuits of the 40 completed 3206 hours, and 16 completed 2342 hours. Of the 40 circuits tested at 360 C, 4 experienced infant mortality failure at about 1000 hours, but the remaining 36 circuits ran without failure for 2618 hours. Posttest analysis indicates that metallization deterioration began with scattered formation of void and extruded gold crystals in the connecting runs. The overall test results were considered very encouraging, and operational life is estimated to more than 18,000 hours at 300 deg C. Continued development efforts are recommended.
- Publication:
-
Final Report
- Pub Date:
- September 1984
- Bibcode:
- 1984gec..rept.....L
- Keywords:
-
- Accelerated Life Tests;
- Crystals;
- High Temperature;
- Metallizing;
- Microelectronics;
- Service Life;
- Silicon;
- Systems Integration;
- Deterioration;
- Extruding;
- Injection;
- Logic Circuits;
- Mortality;
- Electronics and Electrical Engineering