Calculating the transient process in the electroacoustic circuit of a flaw inspection device
Abstract
A method is described of calculating the transient process in the electroacoustic circuit of a flaw inspection device in emission and reception conditions. The calculation and experimental results for a circuit containing connected oscillatory loops are presented.
- Publication:
-
Soviet Journal of Nondestructive Testing
- Pub Date:
- October 1984
- Bibcode:
- 1984SvJNT..20..113K