Small aperture analysis of the dual TEM (transverse electromagnetic) cell and an investigation of test object scattering in a single TEM cell
Abstract
Small aperture theory is used to investigate the dual transverse electromagnetic (TEM) cell. Analyzing coupling through an empty versus a loaded aperture leads to a model of dual TEM cell shielding effectiveness measurements. Small obstacle scattering yields results for both the field perturbation and the change in a cell's transmission line characteristics due to the presence of a test object in a TEM cell. Theoretical values are compared to experimental data.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- October 1984
- Bibcode:
- 1984STIN...8524277W
- Keywords:
-
- Apertures;
- Electromagnetism;
- Photoelectric Cells;
- Polarized Electromagnetic Radiation;
- Comparison;
- Cross Polarization;
- Electromagnetic Measurement;
- Mathematical Models;
- Instrumentation and Photography