Effects of transient ionizing radiation in various generations of TTL-circuits in the 54/74 series
Abstract
Radiation effects from transient ionizing radiation in integrated TTL circuits was studied, to find out effects of ionizing initial radiation from nuclear weapon explosions. Radiation susceptiblity of standard Schottky and low power Schottky TTL is discussed.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- March 1984
- Bibcode:
- 1984STIN...8433736G
- Keywords:
-
- Ionizing Radiation;
- Nuclear Explosion Effect;
- Radiation Effects;
- Ttl Integrated Circuits;
- Photoelectric Effect;
- Pulse Amplitude;
- Pulse Duration;
- Pulsed Radiation;
- Schottky Diodes;
- Electronics and Electrical Engineering