Comparison analysis of algorithm for construction of functional tests for combined large-scale integrated circuits
Abstract
The need to choose an effective algorithm for construction of functional tests to be used in systems of input and output monitoring of large-scale integrated circuits (BIS) and super BIS is considered. It is found that the most promising algorithms for this purpose are based on the use of the apparatus of Boolean derivatives (ABD). The potential advantages of ABD are realized with the use of a highly efficient electronic computer of a new generation, equipped with associated parallel processes. The structure and small number of relatively simple ABD modules make it possible to develop an effective and available wide circle of specialists in the construction of functional tests for combined monitoring.
- Publication:
-
USSR Rept Electron Elec Eng JPRS UEE
- Pub Date:
- August 1984
- Bibcode:
- 1984RpEEE.......95A
- Keywords:
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- Algorithms;
- Boolean Functions;
- Integrated Circuits;
- Parallel Processing (Computers);
- Comparison;
- Computer Techniques;
- Input/Output Routines;
- Electronics and Electrical Engineering