Electric field dependence of trapping in one dimension
Abstract
We have derived an exact analytic solution for the electric field and time dependence of the survival fraction in the one-dimensional trapping problem. The intermediate- and long-time behavior is discussed below and above a threshold region of the electric field strength. The mean decay rate is given as a function of trap concentration and electric field strength.
- Publication:
-
Physical Review A
- Pub Date:
- March 1984
- DOI:
- 10.1103/PhysRevA.29.1568
- Bibcode:
- 1984PhRvA..29.1568M
- Keywords:
-
- Crystal Defects;
- Decay Rates;
- Electric Field Strength;
- Elementary Excitations;
- Polyacetylene;
- Trapping;
- Bias;
- Polymeric Films;
- Threshold Currents;
- Solid-State Physics