Total dose and dose rate radiation characterization of EPI-CMOS radiation hardened memory and microprocessor devices
Abstract
- Publication:
-
IEEE Transactions on Nuclear Science
- Pub Date:
- December 1984
- DOI:
- 10.1109/TNS.1984.4333506
- Bibcode:
- 1984ITNS...31.1332G
- Keywords:
-
- Circuit Reliability;
- Cmos;
- Microprocessors;
- Radiation Dosage;
- Radiation Hardening;
- Random Access Memory;
- Access Time;
- Electronic Equipment Tests;
- Environmental Tests;
- Temperature Dependence;
- Electronics and Electrical Engineering