Heavy ion-induced single event upsets of microcircuits - A summary of the Aerospace Corporation test data
Abstract
A summary of heavy ion SEU and latch-up data collected within the last several years is presented in this report. The devices tested range from simple logic circuits to microprocessors including examples of bipolar, CMOS, and NMOS technologies.
- Publication:
-
IEEE Transactions on Nuclear Science
- Pub Date:
- December 1984
- DOI:
- 10.1109/TNS.1984.4333481
- Bibcode:
- 1984ITNS...31.1190K
- Keywords:
-
- Aerospace Environments;
- Electronic Equipment Tests;
- Environmental Tests;
- Heavy Ions;
- Integrated Circuits;
- Radiation Effects;
- Single Event Upsets;
- Bipolar Transistors;
- Circuit Reliability;
- Cmos;
- Logic Circuits;
- Metal Oxide Semiconductors;
- Microprocessors;
- Spacecraft Electronic Equipment;
- Electronics and Electrical Engineering