Properties of material in the submillimeter wave region (instrumentation and measurement of index of refraction)

The Properties of Materials in the Submillimeter Wave Region study was initiated to instrument a system and to make measurements of the complex index of refraction in the wavelength region between 0.1 to 1.0 millimeters. While refractive index data is available for a number of solids and liquids there still exists a need for an additional systematic study of dielectric properties to add to the existing data, to consider the accuracy of the existing data, and to extend measurements in this wavelength region for other selected mateials. The materials chosen for consideration would be those with useful thermal, mechanical, and electrical characteristics. The data is necessary for development of optical components which, for example, include beamsplitters, attenuators, lenses, grids, all useful for development of instrumentation in this relatively unexploited portion of the spectrum.