Empirical background calculation method for multi-channel X-ray spectrometers

A method of background calculation was developed which is applicable to fixed-channel wavelength dispersive spectrometers which cannot directly measure background. The X-ray intensities from a set of high- and low-average atomic number standards are fitted against Rayleigh and Compton scatter parameters to an equation of the form: y - a (x sub 1) + b (x sub 2) + c. Y is the calculated intensity, x(1) and x(2) are Rayleigh and Compton scatter parameters, and c is a constant. Correlation coefficients greater than 0.99 and slopes of 1.00 are obtained for most elements measured. Calculated and measured backgrounds as well as concentrations are reported for selected standard reference materials.