Microelectronics: Report from a conference and visit to Japan, 1982
Abstract
The development of microelectronics, especially vulnerability to ionizing radiation is reviewed. Latch-up free LSI circuits resistant to sea level cosmic radiation are predicted for the commercial market. Since radiation damage due to ionizing radiation occurs in VLSI-processing, the awareness and knowledge of radiation effects among manufacturers may have a positive effect on the vulnerability of modern electronics to ionizing radiation.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- April 1983
- Bibcode:
- 1983STIN...8335302S
- Keywords:
-
- Epitaxy;
- Microelectronics;
- Semiconductor Devices;
- Ionizing Radiation;
- Latch-Up;
- Radiation Shielding;
- Electronics and Electrical Engineering