Subpicosecond electrical sampling
Abstract
The availability of picosecond and subpicosecond laser pulses has made possible the investigation of material processes in that time regime. In connection with the availability of a number of ultrafast electrical devices, a measurement system capable of characerizing electrical signals with picosecond resolution is needed. The present investigation is concerned with the development of ana electrooptic sampling gate capable of characterizing electrical transients with subpicosecond resolution. By combining several conventional electronic instruments, it was found possible to exploit the ultrafast response of the Pockels effect, while retaining a voltage sensitivity of less than 10 to the -7th of the crystal halfwave voltage. The temporal resolution of this system is limited by the finite extent of the optical beam waist and the dispersive characteristics of the modulators striplines.
- Publication:
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IEEE Journal of Quantum Electronics
- Pub Date:
- April 1983
- DOI:
- Bibcode:
- 1983IJQE...19..664V
- Keywords:
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- Data Sampling;
- Electro-Optics;
- Picosecond Pulses;
- Ultrashort Pulsed Lasers;
- Birefringence;
- Gallium Arsenides;
- Laser Mode Locking;
- Temporal Resolution;
- Electronics and Electrical Engineering