Determining electronic components reliability by accelerated life tests
Abstract
Some details of the step-stress method are considered. In particular the procedure of determining the necessary number of components is presented as well as the approach to estimation of the duration of successive steps of the experiment. The considerations and their results are valid for electronic components if their failure-rate model is the Eyring's model or one of its modifications.
- Publication:
-
Reliability and Maintainability
- Pub Date:
- September 1982
- Bibcode:
- 1982rema.rept..565B
- Keywords:
-
- Accelerated Life Tests;
- Circuit Reliability;
- Component Reliability;
- Electronic Equipment;
- Electronic Equipment Tests;
- Integrated Circuits;
- Performance Tests;
- Service Life;
- Confidence Limits;
- Failure;
- Probability Density Functions;
- Electronics and Electrical Engineering