Design methods for complex MOS systems
Abstract
Methods and aids to design complex MOS systems were improved and tested on prototypes of new LSI components. The extension of the cell libraries for both manual and computer layouts resulted in reduced development time. By improvements in circuit design the yield of the CP3F microprocessor and the ultrasonic remote control chips was enhanced. Fundamentals of LSI testing with automated test systems were widened and by standardization of the procedures a shorter development time for new test programs and a better evaluation of components and test structures was achieved. Test programs for current products were optimized with respect to testing time. The introduction of the n-channel Si gate process was prepared by designing and testing special test structures.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- August 1982
- Bibcode:
- 1982STIN...8316667S
- Keywords:
-
- Chips (Electronics);
- Electronic Equipment Tests;
- Large Scale Integration;
- Logic Design;
- Metal Oxide Semiconductors;
- Computer Aided Design;
- Computer Storage Devices;
- Design Analysis;
- Product Development;
- Electronics and Electrical Engineering