An examination of background noise in analog integrated circuits and components
Abstract
The types of integrated analog circuits in existence are reviewed and sources of noise are identified, with attention given to low frequency background noise in bipolar transistors for amplifiers. Typical types of background noise are caused by thermal conditions, grain boundaries, recombination, the 1/f noise due to random carrier trapping, and dislocations in the barrier region of the semiconductors. A value system for characterizing noise from the various sources is defined. Noise in tetrode transistors is explored and methods for locating noise sources are developed. An analogy of surface phenomena is used to show that associating noise with minority carrier trapping is a valid working principle. Experimental results demonstrating manufacturing techniques and architectures which lower or modify the potential for noise are described.
- Publication:
-
Ph.D. Thesis
- Pub Date:
- 1982
- Bibcode:
- 1982PhDT........24S
- Keywords:
-
- Analog Circuits;
- Background Noise;
- Bipolar Transistors;
- Linear Integrated Circuits;
- Low Frequencies;
- Field Effect Transistors;
- Mathematical Models;
- Minority Carriers;
- P-N Junctions;
- Semiconductor Diodes;
- Shot Noise;
- Tetrodes;
- Thermal Noise;
- Transistor Amplifiers;
- Very Low Frequencies;
- Electronics and Electrical Engineering