A dynamic bias system for burn-in or thermal endurance treatments of 8085 A microprocessors
Abstract
A dynamic bias circuit has been developed for the 8085 A microprocessor, which uses a random number generator to produce an instruction sequence and to exercise the control functions during periods of burn-in or accelerated life testing. Advantages include a complete instruction set executed with equal frequency, all registers and pointers cycled through all possible values, and all control functions exercised with all combinations of interrupt mask settings and enable-interrupt control. The control system is readily adapted to control the exercise sequence for other large scale integrated components, including general purpose input-output controllers and universal serial receiver-transmitter controllers, using random data where appropriate and predefined patterns when necessary.
- Publication:
-
Microelectronics Reliability
- Pub Date:
- 1982
- DOI:
- Bibcode:
- 1982MiRe...22..117S
- Keywords:
-
- Bias;
- Microprocessors;
- Random Numbers;
- Signal Generators;
- Thermal Stresses;
- Accelerated Life Tests;
- Burnthrough (Failure);
- Control Equipment;
- Transmitter Receivers;
- Electronics and Electrical Engineering