Measurement of the parameters of digital integrated microcircuits
Abstract
Methods and devices for measuring and monitoring the parameters of digital integrated microcircuits are surveyed. The various classes of digital integrated microcircuits are discussed, along with their characteristics. Methods for measuring static and dynamic parameters are outlined, as are methods for monitoring the microcircuits. Attention is also given to the principles underlying the design of the devices for measuring and monitoring.
- Publication:
-
Moscow Izdatel Radio Sviaz
- Pub Date:
- 1982
- Bibcode:
- 1982MIzRS....R....E
- Keywords:
-
- Digital Systems;
- Integrated Circuits;
- Microelectronics;
- Network Analysis;
- Block Diagrams;
- Control Equipment;
- Electromagnetic Compatibility;
- Parameterization;
- Signal Distortion;
- Transistor Circuits;
- Electronics and Electrical Engineering