Total dose test results for the 8086 microprocessor
Abstract
Commercial devices implemented in HMOS technology, as well as commercial and military standard devices implemented in HMOS II technology, were tested in order to characterize total radiation dose response of the 8086 microprocessor. Functional failures are noted between 6.8 and 25.9 krad(Si), and attention is given to the effects of fabrication technology and clock frequency variation. A list is given of the functional failure modes determined by test software.
- Publication:
-
IEEE Transactions on Nuclear Science
- Pub Date:
- December 1982
- DOI:
- 10.1109/TNS.1982.4336423
- Bibcode:
- 1982ITNS...29.1662M
- Keywords:
-
- Electronic Equipment Tests;
- Metal Oxide Semiconductors;
- Microprocessors;
- Radiation Dosage;
- Radiation Effects;
- Atomic Clocks;
- Computer Programs;
- Fabrication;
- Frequency Stability;
- Technology Assessment;
- Electronics and Electrical Engineering