Failure modes induced in TTL-LS bipolar logics by negative inputs
Abstract
TTL-LS-OO quad two-point NAND bipolar devices of various manufacturers, produced by conventional planar junction-isolated technology, are studied with attention to logic faults induced by negative inputs. Failures are found to be primarily induced by parasitic lateral npn transistors, in view of both SEM and microprobe measurements. It is noted that novel bipolar Schottky logic devices manufactured by means of oxide-isolated technology are less affected by negative input voltages.
- Publication:
-
Alta Frequenza
- Pub Date:
- December 1982
- Bibcode:
- 1982AlFr...51..340C
- Keywords:
-
- Bipolar Transistors;
- Circuit Reliability;
- Failure Modes;
- Schottky Diodes;
- Ttl Integrated Circuits;
- Electrical Faults;
- Gates (Circuits);
- Logical Elements;
- N-P-N Junctions;
- Technology Assessment;
- Transistor Logic;
- Electronics and Electrical Engineering