A fast turn-around facility for Very Large Scale Integration (VLSI)
Abstract
In order to appreciate the critical hardware and software problems associated with the definition and design of very large scale integrated circuits or integrated systems including 1000 - 1,000,000 transistors in a single silicon chip, incisive experiments conducted with actual operating chips are indispensible. The objective of this project is to establish within a university research environment, a facility for the rapid execution of mask generation, wafer fabrication, and functional testing of user-generated custom I. C. designs.
- Publication:
-
Stanford Univ. Report
- Pub Date:
- July 1981
- Bibcode:
- 1981stan.reptR....M
- Keywords:
-
- Chips (Electronics);
- Integrated Circuits;
- Large Scale Integration;
- Computer Programs;
- Computer Systems Programs;
- Field Effect Transistors;
- Systems Integration;
- Electronics and Electrical Engineering