High-throughput, high-resolution soft X-ray crystal spectrometer for Tokamak-plasma studies
Abstract
A Johann-type reflection spectrometer with a wavelength resolution of 15,000 at 0.229 nm (Cr K-alpha) is described. The diffracting crystal is a (310)-quartz plate with 50 x 30 sq mm total and useful area, bent to a radius of 1380 mm. The use of a novel, simple crystal bending device and of a position-sensitive proportional counter makes this instrument interesting also for other domains of X-ray spectroscopy. Results of extended calculations on diffraction properties of quartz as function of diffraction plane index and wavelength are also presented.
- Publication:
-
Journal of Physics E Scientific Instruments
- Pub Date:
- April 1981
- DOI:
- 10.1088/0022-3735/14/4/014
- Bibcode:
- 1981JPhE...14..448P
- Keywords:
-
- Plasma Diagnostics;
- Plasma Spectra;
- Tokamak Devices;
- Toroidal Plasmas;
- X Ray Spectroscopy;
- Crystal Optics;
- Diffraction Patterns;
- High Resolution;
- Spectral Resolution;
- Plasma Physics