Effect of long-term stress on IGFET degradations due to hot electron trapping Matsumoto, H. ; Sawada, K. ; Asai, S. ; Hirayama, M. ; Nagasawa, K. Abstract Publication: IEEE Transactions on Electron Devices Pub Date: August 1981 DOI: 10.1109/T-ED.1981.20460 Bibcode: 1981ITED...28..923M